IOLTS 2010 - Call for Papers

Submission Deadline February 19th, 2010!

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Venue -- Additional Information -- Committees

Scope

Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins, process, voltage and temperature variations, aging and wearout and make integrating on-line testing and fault tolerance mandatory in many modern ICs. The International On-Line Testing Symposium (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas. The symposium also emphasizes on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips. The Symposium is sponsored by the IEEE Computer Society Test Technology Technical Council and organized by TIMA Laboratory, University of Athens, and University of Piraeus.

The topics of interest include (but are not limited to) the following ones:

Reliability issues in nanometer technologies	On-line testing of analog and mixed signal circuits
Radiation effects	On-line testing in automotive, railway, avionics, industry
Design for reliability	On-line testing in the continuous operation of large systems
Design for variability	Field diagnosis, maintainability and reconfiguration
On-line power monitoring and control	Fault-tolerant and fail-safe systems
On-line current, temperature, etc, monitoring	Dependability evaluation
Secure circuit design	Dependable systems design
Fault-based attacks and counter measures	On-line and off-line built-in self-test
Self-checking circuits and coding theory	Synthesis of on-line testable circuits

Submissions

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The IOLTS Program Committee invites authors to submit papers in the above or related technical areas. Accepted papers will be included in formal Proceedings to be published by the IEEE. Papers must be submitted electronically following the instructions provided at the symposium web site. Papers should be in the standard IEEE conferences double-column format. If accepted, papers should be allowed six pages in the IEEE Proceedings of the Symposium.

Key Dates

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Submission deadline:February 19, 2010
Notification of acceptance:April 14 , 2010
Final copy deadline:May 14, 2010

Venue

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IOLTS 2010 will be held in Corfu island which was not named the “Emerald Island” without reason. Corfu's natural beauty hides itself beneath a cloak of emerald green trees, with a mountainous skyline plunging into the bluest of blue waters. Elegant architecture, sun drenched beaches, enchanting night life, and fine cuisine all play their part in attracting visitors from all over the world.

Additional Information

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Submission Information		General Information
Dimitris Gizopoulos	Abhijit Chatterjee	Michael Nicolaidis	Antonis Paschalis
University of Piraeus Department of Informatics Piraeus, Greece Tel: +30 210 414 2372 dgizop@unipi.gr	Georgia Tech School of ECE Atlanta, Georgia, USA Tel: +1 404.894.1880 chat@ece.gatech.edu	TIMA Laboratory Grenoble, France Tel: +33 (0) 4 76 57 46 96 Michael.Nicolaidis@imag.fr	University of Athens Dept. of Informatics & Telecomm. Athens, Greece Tel: +30 210 727 5231 paschali@di.uoa.gr

Committees

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General Chairs
M. Nicolaidis, TIMA Laboratory
A. Paschalis, U. Athens

Program Chairs
D. Gizopoulos, U. Piraeus
A. Chatterjee, Georgia Tech.

Vice-General Chairs
Y. Zorian, Virage Logic
X. Vera, Intel Labs Barcelona

Vice-Program Chairs
S. Chakravarty, LSI Logic
M. Abadir, Freescale

Special Sessions
R. Aitken, ARM
Y. Makris, Yale U.

Local Arrangements
A.Merentitis, U. Athens
G. Theodorou, U. Athens

Publications
M. Psarakis, U. Piraeus
N. Zergainoh, TIMA Laboratory

Publicity
L. Anghel, TIMA Laboratory
R. Velazco, TIMA Laboratory

Finance
N. Kranitis, U. Athens

Audio Visual
N. Foutris, U. Piraeus
V. Dimitsas, U. Piraeus

ETTTC Liaison
M. Sonza Reorda, Politec. di Torino

Program Committee
J. Abraham, U. Texas at Austin
D. Alexandrescu, iRoC
D. Appello, ST Microelectronics
M. Baklashov, ARM
R. Baumann, TI
M. Benabdenbi, LIP6
N. Bidokhti, Cisco
E. Boehl, Robert Bosch GmbH
N. Buard, EADS
A. Bystrov, U. Newcastle
Y. Cao, Arizona State U.
V. Chandra, ARM
J. Collet, LAAS
G. Di Natale, LIRMM
R. Drechsler, U. Bremen
P. Fouillat, IXL-ENSEIRB
G. Georgakos, Infineon
P. Girard, LIRMM
M. Goessel, U. Postdam
W. Gustin, Infineon
A. Haggag, Freescale
J. Hayes, U. Michigan
T. Heijmen, NXP
S. Hellebrand, U. Paderborn
E. Ibe, Hitachi
A. Ivanov, U. Brit. Columbia
R. Iyer, U. Illinois
A. Krasniewski, Warsaw U. T.
R. Kumar, U. Illinois
S. Kundu, U. Mass. Amherst
R. Leveugle, TIMA
A. Majumdar, AMD/ATI
C. Metra, U. Bologna
M. Miranda, IMEC
S. Mitra, Stanford U.
F. Monteiro, U. Metz
S. Mukhopadhyaya, Georgia Tech.
D. Nikolos, U. Patras
P. Pande, Washington State U.
C. Papachristou, CWRU
R. Parekhji, TI
B. Paul, Toshiba
Z. Peng, Linkoping U.
S. Piestrak, U. Metz
M. Pignol, CNES
I. Polian, U. Freiburg
D. Pradhan, U. Bristol
P. Prinetto, Politec. di Torino
H. Puchner, Cypress
M. Rebaudengo, Politec. di Torino
K. Roy, Purdue U.
M. Santos, INESC-ID
J. Segura, U. Illes Balears
N. Seifert, Intel
E. Simeu, TIMA Laboratory
A. Singh, Auburn U.
C. Slayman
H. Stratigopoulos, TIMA
J. P. Teixeira, IST/INESC-ID
N. Touba, U. Texas
S. Tragoudas, U. Southern Illinois
T. Uemura, Fujitsu Labs
F. Vargas, PUCRS
M. Violante, Politec. di Torino
I. Voyiatzis, TEI Athens
L.-C. Wang, UC Santa Barbara
H. J. Wunderlich, U. Stuttgart
Q. Xu, Chinese U. Hong Kong

For more information, visit us on the web at: http://tima.imag.fr/conferences/iolts

The 16th IEEE International On-Line Testing Symposium (IOLTS2010) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).